Electrochemical migration — Selection criteria for protection concepts

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[Dr. Helmut Schweigart, Sandra Pilz]

Find the right protection concept against electrochemical migration and other defects. Learn about the crucial criteria for increasing PCB reliability. Request now for improved protection!

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Selection criteria for protection concepts

When considering how to increase the reliability and longevity of electronic PCBs, one is regularly confronted with a wide range of options for protecting PCBs against electrochemical migration as well as other types of defects resulting from dirt and moisture.
But how can the right protection concept be chosen, and which are the most important criteria to help decide on this?

Previously in this article we described what was needed for it to occur, its mechanism, and its potential consequences.


Dr. Helmut Schweigart Head of Reliability & Surfaces, ZESTRON EUROPE Dr. Helmut Schweigart obtained his doctorate for research into the reliability of electronic sub-assemblies, and he has been employed at ZESTRON Europe since the early days of the company. He is now Head of Reliability & Surfaces Team. He is also a member of the Board of Management at GfKORR (Gesellschaft für Korrosionsschutz - a company specialising in corrosion inhibitors) as well as an active member of GUS (Gesellschaft für Umweltsimulation - an environmental simulation company) and of the IPC. He has already published numerous technical articles.
Sandra Pilz Group Manager Product Management, ZESTRON EUROPE Sandra Pilz has been working in product management at ZESTRON for more than 15 years and is responsible for the fields of component cleaning, power electronics and advanced packaging as well as for the global coordination of product management. In addition to product development in Europe, she oversees the activities of the local teams in North Asia, South Asia, Japan and the USA. In addition, she organises ZESTRON's trade fair appearances at SMT and Productronica and contributes to various technical articles.

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